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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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AD9696 датащи(PDF) 3 Page - Analog Devices |
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AD9696 датащи(HTML) 3 Page - Analog Devices |
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3 / 8 page  0 C to +70 C –55 C to +125 C AD9696/AD9698 AD9696/AD9698 Test KN/KQ/KR TQ Parameter Temp Level Min Typ Max Min Typ Max Units POWER SUPPLY 6 Positive Supply Current 7 (+5.0 V) AD9696 Full VI 26 32 26 32 mA AD9698 Full VI 52 64 52 64 mA Negative Supply Current 8 (–5.2 V) AD9696 Full VI 2.5 4.0 2.5 4.0 mA AD9698 Full VI 5.0 8.0 5.0 8.0 mA Power Dissipation AD9696 +5.0 V Full V 130 130 mW AD9696 ±5.0 V Full V 146 146 mW AD9698 +5.0 V Full V 260 260 mW AD9698 ±5.0 V Full V 292 292 mW Power Supply Rejection Ratio 9 +25 °CVI 70 70 dB Full VI 65 65 dB NOTES 1Absolute maximum ratings are limiting values, to be applied individually, and beyond which the serviceability of the circuit may be impaired. Functional operability is not necessarily implied. Exposure to absolute maximum rating conditions for an extended period of time may affect device reliability. 2Typical thermal impedances: AD9696 Metal Can θ JA = 170°C/W θ JC = 50°C/W AD9696 Ceramic DIP θ JA = 110°C/W θ JC = 20°C/W AD9696 Plastic DIP θ JA = 160°C/W θ JC = 30°C/W AD9696 Plastic SOIC θ JA = 180°C/W θ JC = 30°C/W AD9698 Ceramic DIP θ JA = 90°C/W θ JC = 25°C/W AD9698 Plastic DIP θ JA = 100°C/W θ JC = 20°C/W AD9698 Plastic SOIC θ JA = 120°C/W θ JC = 20°C/W 3Load circuit has 420 Ω from +V S to output; 460 Ω from output to ground. 4R S ≤100 Ω. 5Propagation delays measured with 100 mV pulse; 10 mV overdrive. 6Supply voltages should remain stable within ±5% for normal operation. 7Specification applies to both +5 V and ±5 V supply operation. 8Specification applies to only ±5 V supply operation. 9Measured with nominal values ±5% of +V S and –VS. 10Although fall time is faster than rise time, the complementary outputs cross at midpoint of logic swing because of delay on start of falling edge. Specifications subject to change without notice. EXPLANATION OF TEST LEVELS Test Level I – 100% production tested. II – 100% production tested at +25 °C, and sample tested at specified temperatures. III – Sample tested only. IV – Parameter is guaranteed by design and characterization testing. V – Parameter is a typical value only. VI – All devices are 100% production tested at +25 °C. 100% production tested at temperature extremes for extended temperature devices; sample tested at temp- erature extremes for commercial/industrial devices. ORDERING GUIDE Package Model Package Temperature Option 1 AD9696KN Plastic DIP 0 °C to +70°C N-8 AD9696KR SOIC 0 °C to +70°C R-8 AD9696KQ Cerdip 0 °C to +70°C Q-8 AD9696TQ Cerdip –55 °C to +125°C Q-8 AD9696TZ/883B 2 Gullwing –55 °C to +125°C Z-8A AD9698KN Plastic DIP 0 °C to +70°C N-16 AD9698KR SOIC 0 °C to +70°C R-16A AD9698KQ Cerdip 0 °C to +70°C Q-16 AD9698TQ Cerdip –55 °C to +125°C Q-16 AD9698TZ/883B 3 Gullwing –55 °C to +125°C Z-16 NOTES 1N = Plastic DIP, Q = Cerdip, R = Small Outline (SOIC), Z = Ceramic Leaded Chip Carrier. 2Refer to AD9696TZ/883B military data sheet. 3Refer to AD9698TZ/883B military data sheet. AD9696/AD9698 –3– REV. B |
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