AD9660 datasheet(2/12 Pages) AD

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Test

AD9660KR

Parameter

Level

Temp

Min

Typ

Max

Units

Conditions

ANALOG INPUTS

(WRITE LEVEL, BIAS LEVEL)

Input Voltage Range

Full

VREF

VREF + 1.6

Input Bias Current

+25

°C

–50

+50

µA

Analog Bandwidth

Full

MHz

External Hold Cap = 20 pF

OUTPUTS

Maximum Output Current, IOUT

+25

°C

200

VOUT = 2.5 V

IOUT

+25

°C

180

VOUT = 3.0 V

Bias Current, IBIAS

+25

°C90

VOUT = 3.0 V

Modulation Current, IMODULATION

+25

°C60

VOUT = 3.0 V

Offset Current, IOFFSET

+25

°C30

VOUT = 3.0 V

Output Compliance Range

+25

°C

3.0

Idle Current

+25

°C

WRITE PULSE = LOW,

DISABLE = HIGH

SWITCHING PERFORMANCE

Maximum Pulse Rate

+25

°C

200

250

MHz

3 dB Reduction in IOUT

Output Propagation Delay (tPD), Rising

Full

1.6

3.0

Output Propagation Delay (tPD), Falling

Full

1.6

2.5

Output Current Rise Time

Full

1.1

1.5

1.7

Output Current Fall Time

Full

1.4

2.0

2.8

WRITE CAL Aperture Delay

+25

°C13

Disable Time

+25

°C5

HOLD NODES

(WRITE HOLD, BIAS HOLD)

Input Bias Current

+25

°C

–200

200

VHOLD = 2.5 V

Input Voltage Range

Full

VREF

VREF + 1.6 V

Open Loop Application Only

Minimum External Hold Cap

Full

TTL INPUTS

Logic “1” Voltage

+25

°C

2.0

DISABLE = LOW

Logic “1” Voltage

Full

2.0

While Other

Logic “0” Voltage

+25

°C

0.8

TTL Inputs Are

Logic “0” Voltage

Full

0.8

Tested

Logic “1” Current

+25

°C

–10

µA

Logic “0” Current

+25

°C

–1.5

BANDGAP REFERENCE

Output Voltage VREF

+25

°C

1.55

1.75

1.90

Temperature Coefficient

–0.2

mV/

°C

Output Current

+25

°C

–0.5

1.0

SENSE IN

Current Gain

+25

°C

1.85

mA/mA

Voltage

+25

°C

3.7

4.0

4.3

IMONITOR = 2 mA

Input Resistance

+25

°C

<150

Ω

POWER SUPPLY (DISABLE = HIGH)

+VS Voltage

+25

°C

4.75

5.00

5.25

DISABLE = HIGH

+VS Current

+25

°C

110

150

Power Dissipation

+25

°C

550

OFFSET CURRENT

OFFSET SET Voltage

+25

°C

1.1

1.4

1.7

IMONITOR = 4.0 mA

NOTES

1Propagation delay measured from the 50% of the rising/falling transition of WRITE PULSE to 50% point of the rising/falling edge of the output modulation current.

2Rise time measured between the 10% and 90% points of the rising transition of the modulation current.

3Fall time measured between the 10% and 90% points of the falling transition of the modulation current.

4Aperture Delay is measured from the 50% point of the rising edge of WRITE PULSE to the time when the output modulation begins to recalibrate, WRITE CAL is

held during this test.

5Disable Time is measured from the 50% point of the rising edge of DISABLE to the 50% point of the falling transition of the output current. Fall time during disable

is similar to fall time during normal operation.

6WRITE PULSE, WRITE CAL, BIAS CAL, OFFSET PULSE are TTL compatible inputs.

Specifications subject to change without notice.

AD9660–SPECIFICATIONS

REV. 0

–2–

(+VS = +5 V, Temperature = +25

°C unless otherwise noted. Sourced currents defined

as positive.)

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