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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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23LCV1024 датащи(PDF) 3 Page - Microchip Technology |
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23LCV1024 датащи(HTML) 3 Page - Microchip Technology |
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3 / 30 page  2012 Microchip Technology Inc. Preliminary DS25156A-page 3 23LCV1024 TABLE 1-3: AC TEST CONDITIONS TABLE 1-2: AC CHARACTERISTICS AC CHARACTERISTICS Industrial (I): TA = -40°C to +85°C Param. No. Sym. Characteristic Min. Max. Units Test Conditions 1FCLK Clock frequency — 20 MHz 2TCSS CS setup time 25 — ns 3TCSH CS hold time 50 — ns 4TCSD CS disable time 25 — ns 5 Tsu Data setup time 10 — ns 6THD Data hold time 10 — ns 7TR CLK rise time — 20 ns Note 1 8TF CLK fall time — 20 ns Note 1 9THI Clock high time 25 — ns 10 TLO Clock low time 25 — ns 11 TCLD Clock delay time 25 — ns 12 TV Output valid from clock low —25 ns 13 THO Output hold time 0 — ns Note 1 14 TDIS Output disable time —20 ns Note 1: This parameter is periodically sampled and not 100% tested. AC Waveform: Input pulse level 0.1 VCC to 0.9 VCC Input rise/fall time 5 ns Operating temperature -40°C to +85°C CL = 30 pF — Timing Measurement Reference Level: Input 0.5 VCC Output 0.5 VCC |
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