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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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MLZ2012A3R3W датащи(PDF) 43 Page - Texas Instruments |
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MLZ2012A3R3W датащи(HTML) 43 Page - Texas Instruments |
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43 / 68 page  www.ti.com Test Options on the EVM 8 Test Options on the EVM 8.1 On Chip (ADS1299) Input Short The channel input can be shorted internally by setting the input multiplexer of the individual channel to 001. The global registers must be set as shown in Figure 51. The channel control registers must be set as shown in Figure 50. This test gives the noise in the channel. It also gives the offset in the channel. The result can be seen in the analysis tab. Figure 52 shows a snapshot of the scope for internal input short with gain setting of 24. The channel offset in this example is 23uV and noise is less than 1µVpp. 5000pts at 500sps is taken there by giving data for 10 seconds. Figure 50. Channel Setting for Input Short Test Figure 51. Global Register Settings for Input Short Test 43 SLAU443 – May 2012 EEG Front-End Performance Demonstration Kit Submit Documentation Feedback Copyright © 2012, Texas Instruments Incorporated |
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