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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LRIS64K датащи(PDF) 91 Page - STMicroelectronics |
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LRIS64K датащи(HTML) 91 Page - STMicroelectronics |
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91 / 100 page  LRIS64K Maximum rating Doc ID 15336 Rev 11 91/100 25 Maximum rating Stressing the device above the rating listed in the absolute maximum ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. Table 93. Absolute maximum ratings Symbol Parameter Min. Max. Unit TSTG Storage conditions Sawn Bumped Wafer (kept in its antistatic bag) 15 25 °C tSTG Storage time 6 months ICC Supply current on AC0 / AC1 –20 20 mA VMAX Input voltage on AC0 / AC1 –7 7 V VESD Electrostatic discharge voltage AC0 - AC1 (HBM)(1) 1. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114A, C1 = 100 pF, R1 = 1500 Ω, R2 = 500 Ω). –800 800 V AC0 - AC1 (MM) –100 100 V |
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