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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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CXD3003R датащи(PDF) 14 Page - Sony Corporation |
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CXD3003R датащи(HTML) 14 Page - Sony Corporation |
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14 / 137 page  – 14 – CXD3003R DAC Analog Characteristics Measurement conditions (Ta = 25°C, VDD = 3.3V, Fs = 44.1kHz, signal frequency = 1kHz, measurement band = 4Hz to 20kHz, master clock = 768Fs) S/N ratio THD + N Dynamic range Channel separation Output level Difference in gain between channels 93 0.015 91 91 1.7 0.1 dB % dB dB V (rms) dB Item Typ. Unit (EIAJ) ∗1 (EIAJ) (EIAJ) ∗1, ∗2 (EIAJ) Remarks CXD3003R AO1F AO1R 3.9k 130k 3.9k 3.9k 130k 3.9k 47p 47p 4.7k 4.7k 4.7k 820p 4.7k 820p 4.7k 4.7k 0.015 4.7k 1800p 82p 12k 100 22 OUTPUT ∗1 Using "A" weighting filter ∗2 –60 dB, 1kHz input The analog characteristics measurement circuit is shown below. AO1R AO2F AO2R AO1F TEST DISK DATA Audio Circuit Analog 1ch 2ch Audio Analyzer SHIBASOKU (AM51A) 768fs CXD3003R Block diagram of analog characteristics measurement |
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