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RN2912FS датащи(PDF) 1 Page - Toshiba Semiconductor |
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RN2912FS датащи(HTML) 1 Page - Toshiba Semiconductor |
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1 / 6 page ![]() RN2912FS,RN2913FS 2007-11-01 1 TOSHIBA Transistor Silicon PNP Epitaxial Type (PCT process) (Bias Resistor Built-in Transistor) RN2912FS, RN2913FS Switching, Inverter Circuit, Interface Circuit and Driver Circuit Applications • Two devices are incorporated into a fine pitch small mold (6-pin) package. • Incorporating a bias resistor into a transistor reduces parts count. Reducing the parts count enables the manufacture of ever more compact equipment and lowers assembly cost. • Complementary to RN1912FS and RN1913FS Equivalent Circuit and Bias Resistor Values Absolute Maximum Ratings (Ta = 25°C) (Q1, Q2 common) Unit: mm fS6 0.1±0.05 6 0.8±0.05 1.0±0.05 1 2 0.1±0.05 3 5 4 1.EMIITTER1 2.BASE1 3.COLLECTOR2 4.EMITTER2 5.BASE2 6.COLLECTOR1 (E1) (B1) (C2) (E2) (B2) (C1) JEDEC ― JEITA ― TOSHIBA 2-1F1D Weight: 0.001 g (typ.) R1 B C E 6 5 4 1 2 3 Q1 Q2 Characteristics Symbol Rating Unit Collector-base voltage VCBO −20 V Collector-emitter voltage VCEO −20 V Emitter-base voltage VEBO −5 V Collector current IC −50 mA Collector power dissipation PC (Note 1) 50 mW Junction temperature Tj 150 °C Storage temperature range Tstg −55~150 °C Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Total rating Equivalent Circuit (top view) |
Аналогичный номер детали - RN2912FS |
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Аналогичное описание - RN2912FS |
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