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2SC6126 датащи(PDF) 3 Page - Toshiba Semiconductor |
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2SC6126 датащи(HTML) 3 Page - Toshiba Semiconductor |
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3 / 5 page ![]() 2SC6126 2009-07-07 3 10 0.01 0.1 1.0 Collector current IC (A) VCE (sat) – IC 0.001 0.01 0.1 1 10 IC – VBE Base-emitter voltage VBE (V) 0 0.4 0.8 1.6 1.2 3 0 1 2 Common emitter IC/IB = 30 Single nonrepetitive pulse −55℃ 25℃ Ta=100℃ Common emitter VCE = 2 V Single nonrepetitive pulse Ta=100℃ −55℃ 25℃ Collector-emitter voltage VCE (V) IC – VCE 1 0 0 3 0.2 0.4 0.6 0.8 1 2 Common emitter Ta=25℃ Single nonrepetitive pulse hFE-Ic 1 100 1000 0.001 0.01 0.1 1 10 Collector current IC (A) 0.1 1 10 Collector current IC (A) VBE (sat) – IC 0.001 0.01 0.1 1 10 Common emitter VCE = 2 V Single nonrepetitive pulse −55℃ 25℃ Ta=100℃ −55℃ Ta=100℃ 25℃ 10 0.3 3 100 70 50 30 10 20 IB=2mA 5 10 0.01 1 0.1 Collector −emitter voltage VCE (V) 0.1 1 10 100 Safe operating area *: Single nonrepetitive pulse Ta = 25°C Note that the curves for 100 ms, 10 s and DC operation will be different when the devices aren’t mounted on an FR4 board (glass-epoxy, 1.6 mm thick, Cu area: 645 mm 2). These characteristic curves must be derated linearly with increase in temperature. IC max (pulse) * DC operation Ta = 25°C 10 s* IC max (continuous)* 100 ms* 1 ms* 10 ms* 100μs* Common emitter IC/IB = 30 Single nonrepetitive pulse |
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