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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TNETE100 датащи(PDF) 17 Page - Texas Instruments |
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TNETE100 датащи(HTML) 17 Page - Texas Instruments |
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17 / 26 page  ThunderLAN ™ TNETE100 PCI ETHERNET ™ CONTROLLER SINGLE-CHIP 10 BASE-T WITH MII FOR 100 BASE-T/100VG-AnyLAN ™ SPWS017B – APRIL 1995 – REVISED AUGUST 1996 17 POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251–1443 (c) FIREF TEST CIRCUIT (b) AXMTP AND AXMTN TEST LOAD (AC TESTING) X1 – Fil – Mag 23Z90 (1:1) (a) TTL OUTPUT TEST LOAD 180 Ω FIREF AXMTN AXMTP 78 Ω Point Test CL IOH VLOAD IOL Point Test Test Under Output TTL 50 Ω FXMTN FXMTP X1 50 Ω 50 Ω Point Test 50 Ω X2 50 Ω 50 Ω 25 Ω 25 Ω FXMTN FXMTP Point Test 50 Ω 50 Ω 50 Ω 50 Ω Point Test (e) FXMTP AND FXMTN TEST LOAD (DC TESTING) (d) FXMTP AND FXMTN TEST LOAD (AC TESTING) X2 – Fil – Mag 23Z128 (1: √2) Where: IOL = Refer to IOL in recommended operating conditions IOH = Refer to IOH in recommended operating conditions VLOAD = 1.5 V, typical dc-level verification or 0.7 V, typical timing verification CL = 18 pF, typical load-circuit capacitance Figure 3. Test and Load Circuit |
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