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TC271 датащи(PDF) 5 Page - Texas Instruments |
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TC271 датащи(HTML) 5 Page - Texas Instruments |
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5 / 22 page ![]() TC271 1080 × 580-PIXEL CCD IMAGE SENSOR SOCS039A – JANUARY 1994 – REVISED JUNE 1996 5 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 multiplexer and image-storage area After integration, the multiplexer rearranges two horizontal lines into vertical groups of three and separates and loads the image into the storage area. Figure 1 shows the layout of the multiplexer gate and its interface to the two field memories. Figure 2 shows the interface region between the storage area and the three serial registers. A drain is also provided to clear the image-sensing and image-storage areas of unwanted charge. Such charge can accumulate in the imager during the startup of operation or under special circumstances when nonstandard TV operation is desired. The sensor’s independently addressable memories allow several different modes of sensor operation including (1) a normal-light mode, (2) a low-light mode, (3) a still mode, and (4) a progressive-scan mode. The timing for these four modes is given in Figure 6 through Figure 9. The parallel-transfer timing is shown in Figure 10. serial registers and amplifiers After transfer to the serial registers (see Figure 11, which shows the horizontal timing that gives the necessary sequence of pulses for transfer from the storage area to the serial registers), the charge is converted to a signal voltage at the sense node and buffered with a dual-stage source follower. The three serial registers are typically clocked 120 degrees out of phase with each serial-gate pulse supplying a detection-node reset signal for one of the other two serial gates (see Figure 12). The readout timing, which includes the three serial pulses and the pixel-clamp pulses used in an off-chip double-correlated sampling circuit, is shown in Figure 13. The detection nodes and amplifiers are located some distance from the edge of the storage area. Twelve dummy elements are incorporated at the end of each serial register to span the distance. The location of the dummy elements, which are considered to be part of the amplifiers, is shown in the functional block diagram. A schematic of the detection node and amplifier is given in Figure 3. |
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