www.ti.com

FEATURES

D PACKAGE

(TOP VIEW)

1

2

3

4

5

6

7

14

13

12

11

10

9

8

1A

1B

1Y

2A

2B

2Y

GND

4B

4A

4Y

3B

3A

3Y

DESCRIPTION/ORDERING INFORMATION

CD74ACT86-EP

QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

SCHS357 – MARCH 2006

•

Controlled Baseline

•

SCR-Latchup-Resistant CMOS Process and

Circuit Design

– One Assembly/Test Site, One Fabrication

Site

•

Exceeds 2-kV ESD Protection Per

MIL-STD-883, Method 3015

•

Extended Temperature Performance of

–55

°C to 125°C

•

Enhanced Diminishing Manufacturing

Sources (DMS) Support

•

Enhanced Product-Change Notification

•

•

Inputs Are TTL-Voltage Compatible

•

Speed of Bipolar F, AS, and S, With

Significantly Reduced Power Consumption

•

Balanced Propagation Delays

•

±24-mA Output Drive Current

– Fanout to 15 F Devices

(1)

Component qualification in accordance with JEDEC and

industry standards to ensure reliable operation over an

extended temperature range. This includes, but is not limited

to, Highly Accelerated Stress Test (HAST) or biased 85/85,

temperature cycle, autoclave or unbiased HAST,

electromigration, bond intermetallic life, and mold compound

life. Such qualification testing should not be viewed as

justifying use of this component beyond specified

performance and environmental limits.

The CD74ACT86-EP is a quadruple 2-input exclusive-OR gate. This device performs the Boolean function

Y = A

⊕ B or Y = AB + AB in positive logic.

A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced

in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the

output.

ORDERING INFORMATION

ORDERABLE PART NUMBER

TOP-SIDE MARKING

–55

°C to 125°C

SOIC – D

Tape and Reel

CD74ACT86MDREP

ACT86MEP

(1)

Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at

www.ti.com/sc/package.

FUNCTION TABLE

(EACH GATE)

INPUTS

OUTPUT

Y

A

B

L

L

L

L

H

H

H

L

H

H

H

L

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas

Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2006, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.