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SP3220E датащи(PDF) 13 Page - Sipex Corporation |
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SP3220E датащи(HTML) 13 Page - Sipex Corporation |
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13 / 18 page ![]() 13 11/07/02 SP3220E True +3.0 to +5.0V RS-232 Transceivers © Copyright 2000 Sipex Corporation R RC C C CS S R RS S SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 Figure 14. ESD Test Circuit for Human Body Model R RS S and and R RV V add up to 330 add up to 330Ω Ω ffor IEC1000-4-2. or IEC1000-4-2. RS and RV add up to 330Ω for IEC1000-4-2. Contact-Discharge Module Contact-Discharge Module R RVV R RC C C CSS R RSS SW1 SW1 SW2 SW2 RC Device Under Test DC Power Source CS RS SW1 SW2 RV Contact-Discharge Module Figure 15. ESD Test Circuit for IEC1000-4-2 The Contact Discharge Method applies the ESD current directly to the EUT. This method was devised to reduce the unpredictability of the ESD arc. The discharge current rise time is constant since the energy is directly transferred without the air-gap arc. In situations such as hand held systems, the ESD charge can be directly discharged to the equipment from a person already holding the equipment. The current is transferred on to the keypad or the serial port of the equipment directly and then travels through the PCB and finally to the IC. The circuit models in Figures 14 and 15 represent the typical ESD testing circuits used for all three methods. The CS is initially charged with the DC power supply when the first switch (SW1) is on. Now that the capacitor is charged, the second switch (SW2) is on while SW1 switches off. The voltage stored in the capacitor is then applied through RS, the current limiting resistor, onto the device under test (DUT). In ESD tests, the SW2 switch is pulsed so that the device under test receives a duration of voltage. |
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