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7805ACT датащи(PDF) 10 Page - Motorola, Inc

номер детали 7805ACT
подробное описание детали  THREE TERMINAL POSITIVE FIXED VOLTAGE REGULATORS
PDF  16 Pages
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производитель  MOTOROLA [Motorola, Inc]
домашняя страница  http://www.freescale.com
Logo MOTOROLA - Motorola, Inc

7805ACT датащи(HTML) 10 Page - Motorola, Inc

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MC7800, MC7800A, LM340, LM340A Series
10
MOTOROLA ANALOG IC DEVICE DATA
ELECTRICAL CHARACTERISTICS (continued) (Vin = 23 V, IO = 1.0 A, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7815AC/LM340AT–15
Characteristic
Symbol
Min
Typ
Max
Unit
Ripple Rejection
RR
60
80
dB
18.5 Vdc
≤ Vin ≤ 28.5 Vdc, f = 120 Hz, IO = 500 mA
Dropout Voltage (IO = 1.0 A, TJ = 25°C)
VI – VO
2.0
Vdc
Output Noise Voltage (TA = 25°C)
Vn
10
µV/VO
10 Hz
≤ f ≤ 100 kHz
Output Resistance f = 1.0 kHz
rO
1.2
m
Short Circuit Current Limit (TA = 25°C)
ISC
0.2
A
Vin = 35 Vdc
Peak Output Current (TJ = 25°C)
Imax
2.2
A
Average Temperature Coefficient of Output Voltage
TCVO
–1.0
mV/
°C
ELECTRICAL CHARACTERISTICS (Vin = 27 V, IO = 500 mA, TJ = Tlow to Thigh [Note 1], unless otherwise noted.)
MC7818C
Characteristic
Symbol
Min
Typ
Max
Unit
Output Voltage (TJ = 25°C)
VO
17.3
18
18.7
Vdc
Output Voltage (5.0 mA
≤ IO ≤ 1.0 A, PD ≤ 15 W)
VO
17.1
18
18.9
Vdc
21 Vdc
≤ Vin ≤ 33 Vdc
Line Regulation, (Note 2)
Regline
mV
21 Vdc
≤ Vin ≤ 33 Vdc
9.5
50
24 Vdc
≤ Vin ≤ 30 Vdc
3.2
25
Load Regulation, (Note 2)
Regload
2.0
55
mV
5.0 mA
≤ IO ≤ 1.5 A
Quiescent Current
IB
3.5
6.5
mA
Quiescent Current Change
∆IB
mA
21 Vdc
≤ Vin ≤ 33 Vdc
1.0
5.0 mA
≤ IO ≤ 1.0 A
0.5
Ripple Rejection
RR
53
57
dB
22 Vdc
≤ Vin ≤ 33 Vdc, f = 120 Hz
Dropout Voltage (IO = 1.0 A, TJ = 25°C)
ViI – VO
2.0
Vdc
Output Noise Voltage (TA = 25°C)
Vn
10
µV/VO
10 Hz
≤ f ≤ 100 kHz
Output Resistance f = 1.0 kHz
rO
1.3
m
Short Circuit Current Limit (TA = 25°C)
ISC
0.2
A
Vin = 35 Vdc
Peak Output Current (TJ = 25°C)
Imax
2.2
A
Average Temperature Coefficient of Output Voltage
TCVO
–1.5
mV/
°C
NOTES: 1. Tlow = –40°C for MC78XXAC, C
Thigh = +125°C for MC78XXAC, C
2. Load and line regulation are specified at constant junction temperature. Changes in VO due to heating effects must be taken into account
separately. Pulse testing with low duty cycle is used.



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