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BA2902F датащи(PDF) 23 Page - Rohm |
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BA2902F датащи(HTML) 23 Page - Rohm |
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23 / 26 page ![]() Technical Note BA10358F/FV, BA10324AF/FV, BA2904SF/FV/FVM, BA2904F/FV/FVM BA2902SF/FV/KN, BA2902F/FV/KN, BA3404F/FVM 23/25 www.rohm.com 2011.08 - Rev.B © 2011 ROHM Co., Ltd. All rights reserved. ● Notes for use 1) Unused circuits When there are unused circuits, it is recommended that they be connected as in Fig.127, setting the non-inverting input terminal to a potential within the in-phase input voltage range (Vicm). 2) Input voltage Applying VEE+32[V] (BA2904S / BA2904 /BA2902S / BA2902 family, BA2904HFVM-C) and VEE+36[V](BA3404 family) to the input terminal is possible without causing deterioration of the electrical characteristics or destruction, irrespective of the supply voltage. However, this does not ensure normal circuit operation. Please note that the circuit operates normally only when the input voltage is within the common mode input voltage range of the electric characteristics. 3) Power supply (single / dual) The op-amp operates when the voltage supplied is between VCC and VEE Therefore, the single supply op-mp can be used as a dual supply op-amp as well. 4) Power dissipation (Pd) Using the unit in excess of the rated power dissipation may cause deterioration in electrical characteristics due to the rise in chip temperature, including reduced current capability. Therefore, please take into consideration the power dissipation (Pd) under actual operating conditions and apply a sufficient margin in thermal design. Refer to the thermal derating curves for more information. 5) Short-circuit between pins and erroneous mounting Incorrect mounting may damage the IC. In addition, the presence of foreign substances between the outputs, the output and the power supply, or the output and GND may result in IC destruction. 6) Operation in a strong electromagnetic field Operation in a strong electromagnetic field may cause malfunctions. 7) Radiation This IC is not designed to withstand radiation. 8) IC handing Applying mechanical stress to the IC by deflecting or bending the board may cause fluctuation of the electrical characteristics due to piezoelectric (piezo) effects. 9) IC operation The output stage of the IC is configured using Class C push-pull circuits. Therefore, when the load resistor is connected to the middle potential of VCC and VEE, crossover distortion occurs at the changeover between discharging and charging of the output current. Connecting a resistor between the output terminal and GND, and increasing the bias current for Class A operation will suppress crossover distortion. 10) Board inspection Connecting a capacitor to a pin with low impedance may stress the IC. Therefore, discharging the capacitor after every process is recommended. In addition, when attaching and detaching the jig during the inspection phase, ensure that the power is turned OFF before inspection and removal. Furthermore, please take measures against ESD in the assembly process as well as during transportation and storage. 11) Output capacitor Discharge of the external output capacitor to VCC is possible via internal parasitic elements when VCC is shorted to VEE, causing damage to the internal circuitry due to thermal stress. Therefore, when using this IC in circuits where oscillation due to output capacitive load does not occur, such as in voltage comparators, use an output capacitor with a capacitance less than 0.1μF. Fig. 127 Example of processing unused circuit VCC VEE 同相入力電圧 範囲内の電位 Please keep this potencial in Vicm |
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