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CC2500-RTR1 датащи(PDF) 80 Page - Texas Instruments

номер детали CC2500-RTR1
подробное описание детали  Low-Cost Low-Power 2.4 GHz RF Transceiver
PDF  96 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI - Texas Instruments

CC2500-RTR1 датащи(HTML) 80 Page - Texas Instruments

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CC2500
SWRS040C
Page 80 of 89
0x25: FSCAL1 – Frequency Synthesizer Calibration
Bit
Field Name
Reset
R/W
Description
7:6
Reserved
R0
5:0
FSCAL1[5:0]
32
(0x20)
R/W
Frequency synthesizer calibration result register. Capacitor array
setting for VCO coarse tuning.
Fast frequency hopping without calibration for each hop can be done
by calibrating upfront for each frequency and saving the resulting
FSCAL3, FSCAL2 and FSCAL1 register values. Between each
frequency hop, calibration can be replaced by writing the FSCAL3,
FSCAL2 and FSCAL1 register values corresponding to the next RF
frequency.
0x26: FSCAL0 – Frequency Synthesizer Calibration
Bit
Field Name
Reset
R/W
Description
7
Reserved
R0
6:0
FSCAL0[6:0]
13 (0x0D)
R/W
Frequency synthesizer calibration control. The value to use in
this register is given by the SmartRF
Studio software [5].
0x27: RCCTRL1 – RC Oscillator Configuration
Bit
Field Name
Reset
R/W
Description
7
Reserved
0
R0
6:0
RCCTRL1[6:0]
65
(0x41)
R/W
RC oscillator configuration.
0x28: RCCTRL0 – RC Oscillator Configuration
Bit
Field Name
Reset
R/W
Description
7
Reserved
0
R0
6:0
RCCTRL0[6:0]
0
(0x00)
R/W
RC oscillator configuration.
32.2
Configuration Register Details – Registers that Lose Programming in SLEEP State
0x29: FSTEST – Frequency Synthesizer Calibration Control
Bit
Field Name
Reset
R/W
Description
7:0
FSTEST[7:0]
89
(0x59)
R/W
For test only. Do not write to this register.
0x2A: PTEST – Production Test
Bit
Field Name
Reset
R/W
Description
7:0
PTEST[7:0]
127
(0x7F)
R/W
Writing 0xBF to this register makes the on-chip temperature sensor
available in the IDLE state. The default 0x7F value should then be
written back before leaving the IDLE state.
Other use of this register is for test only.



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