IRF460 datasheet(2/2 Pages) SEME-LAB

2 / 2 page

IRF460

Prelim. 11/98

Semelab plc. Telephone +44(0)1455 556565. Fax +44(0)1455 552612. e-mail sales@semelab.co.uk

Website http://www.semelab.co.uk

Characteristic

Test Conditions

Min.

Typ.

Max. Unit

Ciss

Coss

Crss

Qgs

Qgd

td(on)

td(off)

Characteristic

Test Conditions

Min.

Typ.

Max. Unit

1.8

580

8.1

ISM

VSD

trr

Qrr

(Body Diode)

VGS = 0V , IS = – ID [Cont.]

IS = – ID [Cont.] , dls / dt = 100A/µs

Continuous Source Current

Pulsed Source Current1

Diode Forward Voltage2

Reverse Recovery Time

Reverse Recovery Charge

µC

Characteristic

Min.

Typ.

Max. Unit

0.42

RθJC

RθJA

Junction to Case

Junction to Ambient

°C/W

DYNAMIC CHARACTERISTICS

SOURCE – DRAIN DIODE RATINGS AND CHARACTERISTICS

THERMAL CHARACTERISTICS

1) Repetitive Rating: Pulse Width limited by maximum junction temperature.

2) Pulse Test: Pulse Width < 380

µS , Duty Cycle < 2%

3) See MIL–STD–750 Method 3471

Input Capacitance

Output Capacitance

Reverse Transfer Capacitance

Total Gate Charge3

Gate – Source Charge

Gate – Drain (“Miller”) Charge

Turn–on Delay Time

Rise Time

Turn-off Delay Time

Fall Time

VGS = 0V

VDS = 25V

f = 1MHz

VGS = 10V

VDD = 0.5 VDSS

ID = ID [Cont.] @ 25°C

VGS = 15V

VDD = 0.5 VDSS

ID = ID [Cont.] @ 25°C

RG = 1.8Ω

2890

590

230

140

190

135

120

130

CAUTION — Electrostatic Sensitive Devices. Anti-Static Procedures Must Be Followed.

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