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LTC2913 датащи(PDF) 12 Page - Linear Technology |
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LTC2913 датащи(HTML) 12 Page - Linear Technology |
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12 / 16 page ![]() LTC4365 12 4365f The trace at VOUT, on the other hand, does not respond to the negative voltage at VIN, demonstrating the desired reverse supply protection. The waveforms of Figure 7 were captured using a 40V dual N-channel MOSFET, a 10μF ceramic output capacitor and no load current on VOUT. Recovery Timer The LTC4365 has a recovery delay timer that filters noise at VIN and helps prevent chatter at VOUT. After either an OV or UV fault has occurred, the input supply must return to the desired operating voltage window for at least 36ms in order to turn the external MOSFET back on as illustrated in Figures 4 and 5. Going out of and then back into fault in less than 36ms will keep the MOSFET off continuously. Similarly, coming out of shutdown (SHDN low to high) triggers an 800μs start-up delay timer (see Figure 10). The recovery timer is also active while the LTC4365 is powering up. The 36ms timer starts once VIN rises above VIN(UVLO) and VIN lies within the user selectable UV/OV power good window. See Figure 8. Gentle Shutdown The SHDN input turns off the external MOSFETs in a gentle, controlled manner. When SHDN is asserted low, a 90μA current sink slowly begins to turn off the external MOSFETs. Once the voltage at the GATE pin falls below the voltage at the VOUT pin, the current sink is throttled back and a feedback loop takes over. This loop forces the GATE voltage to track VOUT, thus keeping the external MOSFETs off as VOUT decays. Note that when VOUT < 4.5V, the GATE pin is pulled to within 400mV of ground. Gentle gate turn off reduces load current slew rates and mitigates voltage spikes due to parasitic inductances. To further decrease GATE pin slew rate, place a capaci- tor across the gate and source terminals of the external MOSFETs. The waveforms of Figure 9 were captured using the Si4230 dual N-channel MOSFETs, and a 2A load with 100μF output capacitor. APPLICATIONS INFORMATION 4365 F08 GATE MOSFET OFF MOSFET ON VIN VIN(UVLO) tRECOVERY Figure 8. Recovery Timing During Power-On (OV = GND, UV = SHDN = VIN) Figure 9. Gentle Shutdown: GATE Tracks VOUT as VOUT Decays GATE VOUT tGATE(SLOW) GATE = VOUT tSTART tSHDN(F) ΔVGATE SHDN 4365 F10 FAULT Figure 10. Gentle Shutdown Timing FAULT Status The FAULT high voltage open drain output is driven low if SHDN is asserted low, if VIN is outside the desired UV/OV voltage window, or if VIN has not risen above VIN(UVLO). Figures 4, 5 and 10 show the FAULT output timing. 5V/DIV 4365 F9 100μs/DIV GATE VOUT SHDN VIN = 12V T = 25°C GND |
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