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R8C датащи(PDF) 80 Page - Renesas Technology Corp |
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R8C датащи(HTML) 80 Page - Renesas Technology Corp |
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80 / 106 page ![]() R01DS0011EJ0100 Rev.1.00 Page 80 of 102 Dec 21, 2010 R8C/LA3A Group, R8C/LA5A Group, R8C/LA6A Group, R8C/LA8A Group 5. Electrical Characteristics Note: 1. When the digital filter is disabled. Notes: 1. Definition of programming/erasure endurance The programming and erasure endurance is defined on a per-block basis. If the programming and erasure endurance is n (n = 1,000), each block can be erased n times. For example, if 1,024 1-byte writes are performed to different addresses in block A, a 1 Kbyte block, and then the block is erased, the programming/erasure endurance still stands at one. However, the same address must not be programmed more than once per erase operation (overwriting prohibited). 2. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed). 3. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example, when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups before erasing them all in one operation. It is also advisable to retain data on the erasure endurance of each block and limit the number of erase operations to a certain number. 4. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase command at least three times until the erase error does not occur. 5. Customers desiring program/erase failure rate information should contact their Renesas technical support representative. 6. The data hold time includes time that the power supply is off or the clock is not supplied. Table 5.34 Gain Amplifier Characteristics (VSS = 0 V and Topr = −20 to 85 °C (N version)/−40 to 85 °C (D version), unless otherwise specified.) Symbol Parameter Conditions Standard Unit Min. Typ. Max. VGAIN Gain amplifier operating range 0.4 – AVCC – 1.0 V φAD A/D conversion clock 1 – 5 MHz Table 5.35 Comparator B Characteristics (VCC = 1.8 to 5.5 V and Topr = −20 to 85°C (N version)/ −40 to 85°C (D version), unless otherwise specified.) Symbol Parameter Condition Standard Unit Min. Typ. Max. Vref IVREF1, IVREF3 input reference voltage 0 – VCC − 1.4 V VI IVCMP1, IVCMP3 input voltage -0.3 – VCC + 0.3 V − Offset – 5 100 mV td Comparator output delay time (1) VI = Vref ± 100 mV – – 1 µs ICMP Comparator operating current VCC = 5.0 V – 12 – µA Table 5.36 Flash Memory (Program ROM) Characteristics (VCC = 1.8 to 5.5 V and Topr = 0 to 60 °C, unless otherwise specified.) Symbol Parameter Conditions Standard Unit Min. Typ. Max. – Program/erase endurance (1) 10,000 (2) –– times – Byte program time – 80 – µs – Block erase time – 0.12 – s td(SR-SUS) Time delay from suspend request until suspend – – 0.25 + CPU clock × 3 cycles ms – Time from suspend until erase restart – – 30 + CPU clock × 1 cycle µs td(CMDRST-READY) Time from when command is forcibly terminated until reading is enabled – – 30 + CPU clock × 1 cycle µs – Program, erase voltage 1.8 – 5.5 V – Read voltage 1.8 – 5.5 V – Program, erase temperature 0 – 60 °C – Data hold time (6) Ambient temperature = 85 °C 10 – – year |
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