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DMN4027SSD датащи(PDF) 2 Page - Diodes Incorporated |
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DMN4027SSD датащи(HTML) 2 Page - Diodes Incorporated |
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2 / 8 page ![]() DMN4027SSD Document Number DS31204 Rev 1 - 2 2 of 8 www.diodes.com March 2010 © Diodes Incorporated A Product Line of Diodes Incorporated DMN4027SSD Maximum Ratings @TA = 25°C unless otherwise specified Characteristic Symbol Value Unit Drain-Source voltage VDSS 40 V Gate-Source voltage (Note 2) VGS ±20 V Continuous Drain current VGS = 10V (Note 4) ID 7.1 A TA = 70°C (Note 4) 5.7 (Note 3) 5.4 Pulsed Drain current VGS= 10V (Note 5) IDM 28.0 A Continuous Source current (Body diode) (Note 4) IS 3.3 A Pulsed Source current (Body diode) (Note 5) ISM 28.0 A Thermal Characteristics @TA = 25°C unless otherwise specified Characteristic Symbol Value Unit Power dissipation Linear derating factor (Notes 3 & 6) PD 1.25 10.0 W mW/ °C (Notes 3 & 7) 1.8 14.3 (Notes 4 & 6) 2.1 17.1 Thermal Resistance, Junction to Ambient (Notes 3 & 6) RθJA 100 °C/W (Notes 3 & 7) 70 (Notes 4 & 6) 58 Thermal Resistance, Junction to Lead (Notes 6 & 8) RθJL 53 Operating and storage temperature range TJ, TSTG -55 to 150 °C Notes: 2. AEC-Q101 VGS maximum is ±16V. 3. For a device surface mounted on 25mm x 25mm x 1.6mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions; the device is measured when operating in a steady-state condition. 4. Same as note (3), except the device is measured at t ≤ 10 sec. 5. Same as note (3), except the device is pulsed with D= 0.02 and pulse width 300 µs. The pulse current is limited by the maximum junction temperature. 6. For a dual device with one active die. 7. For a device with two active die running at equal power. 8. Thermal resistance from junction to solder-point (at the end of the drain lead). |
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