Symbol

Parameter

Condition

Min

(Note 6)

Typ

(Note 5)

Max

(Note 6)

Units

BW

Fixed Gain LMP8640-T

LMP8640HV-T (Note 9)

DC V

C

950

kHz

Fixed Gain LMP8640-F

LMP8640HV-F (Note 9)

DC V

C

450

Fixed Gain LMP8640-H

LMP8640HV-H (Note 9)

DC V

C

230

SR

Slew Rate (Note 8, Note 9)

V

LMP8640-T LMP8640HV-T V

LMP8640-F LMP8640HV-F V

LMP8640-H LMP8640HV-H V

1.8

V/µs

R

IN

Differential Mode Input Impedance

(Note 9)

5

k

Ω

I

S

Supply Current

V

720

1050

1250

µA

V

2300

2800

3000

V

OUT

Maximum Output Voltage

V

11.85

V

Minimum Output Voltage

LMP8640-T LMP8640HV-T

V

18.2

mV

LMP8640-F LMP8640HV-F

V

40

LMP8640-H LMP8640HV-H

V

80

C

LOAD

Max Output Capacitance Load

(Note 9)

30

pF

Note 1: “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur, including inoperability and degradation of device reliability

and/or performance. Functional operation of the device and/or non-degradation at the Absolute Maximum Ratings or other conditions beyond those indicated in

the Operating Ratings is not implied. Operating Ratings indicate conditions at which the device is functional and the device should not be operated beyond such

conditions.

Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC) Field-

Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).

Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T

allowable power dissipation P

Note 4: Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating

of the device such that T

T

Note 5: Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and will also depend

on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.

Note 6: Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using statistical quality

control (SQC) method.

Note 7: Offset voltage temperature drift is determined by dividing the change in V

Note 8: The number specified is the average of rising and falling slew rates and measured at 90% to 10%.

Note 9: This parameter is guaranteed by design and/or characterization and is not tested in production.

Note 10: Positive Bias Current corresponds to current flowing into the device.

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