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R5F2L357CDFP датащи(PDF) 51 Page - Renesas Technology Corp

номер детали R5F2L357CDFP
подробное описание детали  RENESAS MCU
PDF  75 Pages
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производитель  RENESAS [Renesas Technology Corp]
домашняя страница  http://www.renesas.com
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R5F2L357CDFP датащи(HTML) 51 Page - Renesas Technology Corp

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R8C/L35C Group, R8C/L36C Group, R8C/L38C Group, R8C/L3AC Group
5. Electrical Characteristics
REJ03B0293-0100 Rev.1.00
Page 51 of 72
Jun 25, 2010
Notes:
1. Definition of programming/erasure endurance
The programming and erasure endurance is defined on a per-block basis.
If the programming and erasure endurance is n (n = 10,000), each block can be erased n times. For example, if 1,024 1-byte
writes are performed to different addresses in block A, a 1 Kbyte block, and then the block is erased, the
programming/erasure endurance still stands at one.
However, the same address must not be programmed more than once per erase operation (overwriting prohibited).
2. Endurance to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed).
3. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential
addresses in turn so that as much of the block as possible is used up before performing an erase operation. For example,
when programming groups of 16 bytes, the effective number of rewrites can be minimized by programming up to 128 groups
before erasing them all in one operation. In addition, averaging the erasure endurance between blocks A to D can further
reduce the actual erasure endurance. It is also advisable to retain data on the erasure endurance of each block and limit the
number of erase operations to a certain number.
4. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase
command at least three times until the erase error does not occur.
5. Customers desiring program/erase failure rate information should contact their Renesas technical support representative.
6.
40°C for D version.
7.
The data hold time includes time that the power supply is off or the clock is not supplied.
Figure 5.2
Time delay until Suspend
Table 5.7
Flash Memory (Data flash Block A to Block D) Characteristics
(VCC = 2.7 to 5.5 V and Topr =
−20 to 85°C (N version) / −40 to 85°C (D version), unless
otherwise specified.)
Symbol
Parameter
Conditions
Standard
Unit
Min.
Typ.
Max.
Program/erase endurance (1)
10,000 (2)
——
times
Byte program time
(program/erase endurance
1,000 times)
160
1500
µs
Byte program time
(program/erase endurance
> 1,000 times)
300
1500
µs
Block erase time
(program/erase endurance
1,000 times)
—0.2
1
s
Block erase time
(program/erase endurance
> 1,000 times)
—0.3
1
s
td(SR-SUS)
Time delay from suspend request until
suspend
5 + CPU clock
× 3 cycles
ms
Interval from erase start/restart until
following suspend request
0—
ms
Time from suspend until erase restart
30+CPU clock
× 1 cycle
µs
td(CMDRST-
READY)
Time from when command is forcibly
terminated until reading is enabled
30+CPU clock
× 1 cycle
µs
Program, erase voltage
2.7
5.5
V
Read voltage
1.8
5.5
V
Program, erase temperature
20 (6)
—85
°C
Data hold time (7)
Ambient temperature = 55
°C
20
year
FST6 bit
Suspend request
(FMR21 bit)
Fixed time
Clock-dependent
time
Access restart
FST6, FST7: Bit in FST register
FMR21: Bit in FMR2 register
FST7 bit
td(SR-SUS)



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