Not Recommended for New Design

CAT521

© 2008 SCILLC. All rights reserved.

3

Doc. No. MD-2003 Rev. I

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS

Parameters

Ratings

Units

Supply Voltage*

-0.5 to +7

V

Inputs

CLK to GND

V

CS to GND

V

DI to GND

V

RDY/BSY

V

PROG to GND

V

V

V

Parameters

Ratings

Units

Outputs

V

V

Operating Ambient Temperature

Commercial

(‘C’ or Blank suffix)

0 to +70

°C

Industrial (‘I’ suffix)

-40 to +85

°C

Junction Temperature

+150

°C

Storage Temperature

-65 to +150

°C

Lead Soldering (10 sec max)

+300

°C

RELIABILITY CHARACTERISTICS

Symbol

Parameter

Test Method

Min

Max

Units

(2)

ESD Susceptibility

MIL-STD-883, Test Method 3015

2000

V

(2)(3)

Latch-Up

JEDEC Standard 17

100

mA

POWER SUPPLY

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Supply Current (Read)

Normal Operating

—

400

600

µA

Supply Current (Write)

—

1600

2500

µA

—

1000

1600

µA

Operating Voltage Range

2.7

—

5.5

V

LOGIC INPUTS

Symbol

Parameter

Conditions

Min

Typ

Max

Units

Input Leakage Current

—

—

10

µA

Input Leakage Current

—

—

-10

µA

High Level Input Voltage

2

—

V

Low Level Input Voltage

0

—

0.8

V

LOGIC OUTPUTS

Symbol

Parameter

Conditions

Min

Typ

Max

Units

High Level Output Voltage

—

—

V

Low Level Output Voltage

—

—

0.4

V

—

—

0.4

V

Notes:

(1) Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this

specification is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

(2) This parameter is tested initially and after a design or process change that affects the parameter.