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TPS54521 датащи(PDF) 3 Page - Texas Instruments |
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TPS54521 датащи(HTML) 3 Page - Texas Instruments |
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3 / 33 page ![]() TPS54521 www.ti.com SLVS981 – JUNE 2010 THERMAL INFORMATION TPS54521 THERMAL METRIC(1)(2)(3) QFN UNITS 14 PINS qJA Junction-to-ambient thermal resistance(4) 47.2 qJA Junction-to-ambient thermal resistance(5) 32 qJCtop Junction-to-case (top) thermal resistance(6) 64.8 qJB Junction-to-board thermal resistance(7) 14.4 °C/W yJT Junction-to-top characterization parameter(8) 0.5 yJB Junction-to-board characterization parameter(9) 14.7 qJCbot Junction-to-case (bottom) thermal resistance(10) 3.2 (1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953. (2) Maximum power dissipation may be limited by overcurrent protection (3) Power rating at a specific ambient temperature TA should be determined with a junction temperature of 125°C. This is the point where distortion starts to substantially increase. Thermal management of the PCB should strive to keep the junction temperature at or below 125°C for best performance and long-term reliability. See power dissipation estimate in application section of this data sheet for more information. (4) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as specified in JESD51-7, in an environment described in JESD51-2a. (5) Test board conditions: (a) 2.5 inches × 2.5 inches, 4 layers, thickness: 0.062 inch (b) 2 oz. copper traces located on the top of the PCB (c) 2 oz. copper ground planes on the 2 internal layers and bottom layer (d) 4 0.010 inch thermal vias located under the device package (6) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. (7) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB temperature, as described in JESD51-8. (8) The junction-to-top characterization parameter, yJT, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining qJA, using a procedure described in JESD51-2a (sections 6 and 7). (9) The junction-to-board characterization parameter, yJB, estimates the junction temperature of a device in a real system and is extracted from the simulation data for obtaining qJA , using a procedure described in JESD51-2a (sections 6 and 7). (10) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88. Copyright © 2010, Texas Instruments Incorporated Submit Documentation Feedback 3 Product Folder Link(s) :TPS54521 |
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