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TPS54521 датащи(PDF) 3 Page - Texas Instruments

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номер детали TPS54521
подробное описание детали  4.5V to 17V Input, 5A Synchronous Step Down SWIFT??Converter
PDF  33 Pages
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TPS54521 датащи(HTML) 3 Page - Texas Instruments

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TPS54521
www.ti.com
SLVS981 – JUNE 2010
THERMAL INFORMATION
TPS54521
THERMAL METRIC(1)(2)(3)
QFN
UNITS
14 PINS
qJA
Junction-to-ambient thermal resistance(4)
47.2
qJA
Junction-to-ambient thermal resistance(5)
32
qJCtop
Junction-to-case (top) thermal resistance(6)
64.8
qJB
Junction-to-board thermal resistance(7)
14.4
°C/W
yJT
Junction-to-top characterization parameter(8)
0.5
yJB
Junction-to-board characterization parameter(9)
14.7
qJCbot
Junction-to-case (bottom) thermal resistance(10)
3.2
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2)
Maximum power dissipation may be limited by overcurrent protection
(3)
Power rating at a specific ambient temperature TA should be determined with a junction temperature of 125°C. This is the point where
distortion starts to substantially increase. Thermal management of the PCB should strive to keep the junction temperature at or below
125°C for best performance and long-term reliability. See power dissipation estimate in application section of this data sheet for more
information.
(4)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(5)
Test board conditions:
(a) 2.5 inches × 2.5 inches, 4 layers, thickness: 0.062 inch
(b) 2 oz. copper traces located on the top of the PCB
(c) 2 oz. copper ground planes on the 2 internal layers and bottom layer
(d) 4 0.010 inch thermal vias located under the device package
(6)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific
JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(7)
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(8)
The junction-to-top characterization parameter, yJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining qJA, using a procedure described in JESD51-2a (sections 6 and 7).
(9)
The junction-to-board characterization parameter, yJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining qJA , using a procedure described in JESD51-2a (sections 6 and 7).
(10) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Copyright © 2010, Texas Instruments Incorporated
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