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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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PESD2CAN датащи(PDF) 6 Page - NXP Semiconductors |
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PESD2CAN датащи(HTML) 6 Page - NXP Semiconductors |
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6 / 11 page  PESD2CAN_1 © NXP B.V. 2006. All rights reserved. Product data sheet Rev. 01 — 22 December 2006 6 of 11 NXP Semiconductors PESD2CAN CAN bus ESD protection diode Fig 9. ESD clamping test setup and waveforms 006aaa941 50 Ω RZ CZ D.U.T. (Device Under Test) unclamped +8 kV ESD pulse waveform (IEC 61000-4-2 network) clamped +8 kV ESD pulse waveform (IEC 61000-4-2 network), Pin 1 to 3 unclamped −8 kV ESD pulse waveform (IEC 61000-4-2 network) clamped −8 kV ESD voltage waveform (IEC 61000-4-2 network), Pin 1 to 3 450 Ω RG 223/U 50 Ω coax ESD TESTER IEC 61000-4-2 network CZ = 150 pF; RZ = 330 Ω 4 GHz DIGITAL OSCILLOSCOPE 10 × ATTENUATOR vertical scale = 10 A/div horizontal scale = 15 ns/div vertical scale = 25 V/div horizontal scale = 100 ns/div vertical scale = 10 A/div horizontal scale = 15 ns/div vertical scale = 25 V/div horizontal scale = 100 ns/div |
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