WM2637

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 July 99

3

Note: Reference voltages greater than VDD/2 will cause saturation for large DAC codes.

ELECTRICAL CHARACTERISTICS

Test Conditions:

Ω, C

temperature range (unless noted otherwise)

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Static DAC Specifications

Resolution

10

bits

Integral non-linearity

INL

See Note 1

LSB

Differential non-linearity

DNL

See Note 2

LSB

Zero code error

ZCE

See Note 3

mV

Gain error

GE

See Note 4

% FSR

D.c. power supply rejection ratio

DC PSRR

See Note 5

0.5

mV/V

Zero code error temperature coefficient

See Note 6

10

ppm/

°C

Gain error temperature coefficient

See Note 6

10

ppm/

°C

DAC Output Specifications

Output voltage range

0

VDD - 0.1

V

Output load regulation

2k

Ω to 10kΩ load

See Note 7

%

Power Supplies

Active supply current

Slow

Fast

Slow

Fast

Slow

Fast

Slow

Fast

See Note 8

2.0

4.2

1.7

3.8

1.7

3.7

1.4

3.4

2.5

5.0

2.1

4.6

2.2

4.6

1.8

4.2

mA

mA

mA

mA

mA

mA

mA

mA

Power down supply current

No load,

all digital inputs 0V or VDD

See Note 9

0.01

10

µA

Dynamic DAC Specifications

Slew rate

DAC code 32 to 1023, 10%-90%

Slow

Fast

See Note 10

1.5

8.0

V/

µs

V/

µs

Settling time

DAC code 32 to 1023

Slow

Fast

See Note 11

3.5

1.0

µs

µs

Glitch energy

Code 511 to 512

10

nV-s

Signal to noise ratio

SNR

BW = 20kHz

See Note 12

53

56

dB

Signal to noise and distortion ratio

SNRD

BW = 20kHz

50

54

dB