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WM2636CD датащи(PDF) 5 Page - Wolfson Microelectronics plc |
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WM2636CD датащи(HTML) 5 Page - Wolfson Microelectronics plc |
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5 / 10 page ![]() WM2636 Production Data WOLFSON MICROELECTRONICS LTD PD Rev 1.0 July 1999 5 SERIAL INTERFACE * t SUC16FS t SUFS SCLK DIN NCS FS 12 34 5 15 16 D0 D1 D12 D13 D14 D15 t WL t WH t SUD t HD t SUCSFS t WHFS t SUC16CS Figure 1 Timing Diagram Test Conditions: RL = 10k Ω, CL = 100pF. VDD = 5V ± 10%, V REF = 2.048V and VDD = 3V ± 10%, V REF = 1.024V over recommended operating free-air temperature range (unless noted otherwise). SYMBOL TEST CONDITIONS MIN TYP MAX UNIT tSUCSFS Setup time NCS low before negative FS edge. 10 ns tSUFS Setup time FS low before first negative SCLK edge. 8ns tSUC16FS Setup time, sixteenth negative edge after FS low on which D0 is sampled before rising edge of FS. 10 ns tSUC16CS Setup time, sixteenth positive SCLK edge (first positive after D0 sampled) before NCS rising edge. If FS is used instead of the sixteenth positive edge to update the DAC, then the setup time is between the FS rising edge and the NCS rising edge. 10 ns tWH Pulse duration, SCLK high. 25 ns tWL Pulse duration, SCLK low. 25 ns tSUD Setup time, data ready before SCLK falling edge. 8ns tHD Hold time, data held valid after SCLK falling edge. 5ns tWHFS Pulse duration, FS high. 20 ns |
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