WM2627

Production Data

WOLFSON MICROELECTRONICS LTD

PD Rev 1.0 April 2001

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at

or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical

Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible

to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage

of this device.

CONDITION

MIN

MAX

Supply voltages, AVDD to AGND, DVDD to DGND

7V

Supply voltage differences, AVDD to DVDD

-2.8V

2.8V

Digital input voltage

-0.3V

DVDD + 0.3V

Reference input voltage

-0.3V

AVDD + 0.3V

WM2627C

WM2627I

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Soldering lead temperature, 1.6mm (1/16 inch) from package body for

10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

AVDD, DVDD

2.7

5.5

V

High-level digital input voltage

DVDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

DVDD = 2.7V to 5.5V

0.8

V

Reference voltage to

REFINAB, REFINCD

See Note

0

AVDD - 1.5

V

Load resistance

210

k

Ω

Load capacitance

100

pF

Serial clock rate

20

MHz

WM2627CDT

0

70

°C

Operating free-air temperature

WM2627IDT

-40

85

°C

Note: Reference voltages greater than AVDD/2 will cause output saturation for large DAC codes.