Production Data

WM2619

WOLFSON MICROELECTRONICS LTD

3

ABSOLUTE MAXIMUM RATINGS

Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously

operating at or beyond these limits. Device functional operating limits and guaranteed performance specifications are given

under Electrical Characteristics at the test conditions specified.

ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically

susceptible to damage from excessive static voltages. Proper ESD precautions must be taken during

handling and storage of this device

CONDITION

MIN

MAX

Digital Supply voltage, VDD to GND

7V

Reference input voltage

-0.3V

VDD + 0.3V

Digital input voltages

-0.3V

VDD + 0.3V

WM2619C

WM2619I

0

°C

-40

°C

70

°C

85

°C

Storage temperature

-65

°C

150

°C

Lead temperature 1.6mm (1/16 inch) soldering for 10 seconds

260

°C

RECOMMENDED OPERATING CONDITIONS

PARAMETER

SYMBOL

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Supply voltage

VDD

2.7

5.5

V

High-level digital input voltage

VDD = 2.7V to 5.5V

2

V

Low-level digital input voltage

VDD = 2.7V to 5.5V

0.8

V

Reference voltage to REFIN

See Note

VDD - 1.5

V

Load resistance

2

10

k

Ω

Load capacitance

100

pF

WM2619C

0

70

°C

Operating free-air temperature

WM2619I

-40

85

°C

Note: Reference input voltages greater than VDD/2 will cause output saturation for large DAC codes.