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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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TAS5711PHPR датащи(PDF) 2 Page - Texas Instruments |
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TAS5711PHPR датащи(HTML) 2 Page - Texas Instruments |
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2 / 64 page  SDIN LRCLK SCLK MCLK RESET PDN SDA PLL_FLTM PLL_FLTP AVDD/DVDD PVDD OUT_A OUT_C OUT_B OUT_D BST_A BST_C BST_B BST_D 3.3 V 8 V–26 V SCL Digital Audio Source I C Control 2 Control Inputs LC SE LC BTL B0264-09 Loop Filter (1) LC SE PVDD PVDD A_SEL( ) FAULT TAS5711 SLOS600 – DECEMBER 2009 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. SIMPLIFIED APPLICATION DIAGRAM (1) See TAS5711 EVM User's Guide (SLOU280) for loop filter values. 2 Submit Documentation Feedback Copyright © 2009, Texas Instruments Incorporated Product Folder Link(s): TAS5711 |
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