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R5F363AMDFB датащи(PDF) 55 Page - Renesas Technology Corp |
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R5F363AMDFB датащи(HTML) 55 Page - Renesas Technology Corp |
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55 / 115 page ![]() REJ03B0271-0100 Rev.1.00 Sep 15, 2009 Page 55 of 113 M16C/63 Group 5. Electrical Characteristics 5.1.5 Flash Memory Electrical Characteristics Notes: 1. Set the PM17 bit in the PM1 register to 1 (one wait). 2. When the frequency is 1.8 ≤ V CC1 ≤ 3.0 V, set the FMR17 bit in the FMR1 register to 0 (one wait) or the PM17 bit in the PM1 register to 1 (one wait) Notes: 1. Definition of program and erase cycles: The program and erase cycles refer to the number of per-block erasures. If the program and erase cycles are n (n = 1,000), each block can be erased n times. For example, if a 64 Kbyte block is erased after writing two word data 16,384 times, each to a different address, this counts as one program and erase cycles. Data cannot be written to the same address more than once without erasing the block (rewrite prohibited). 2. Cycles to guarantee all electrical characteristics after program and erase. (1 to Min. value can be guaranteed). 3. In a system that executes multiple programming operations, the actual erasure count can be reduced by writing to sequential addresses in turn so that as much of the block as possible is used up before performing an erase operation. It is advisable to retain data on the erasure cycles of each block and limit the number of erase operations to a certain number. 4. If an error occurs during block erase, attempt to execute the clear status register command, then execute the block erase command at least three times until the erase error does not occur. 5. Customers desiring program/erase failure rate information should contact their Renesas technical support representative. 6. The data hold time includes time that the power supply is off or the clock is not supplied. 7. After an erase start or erase restart, if an interval of at least 20 ms is not set before the next suspend request, the erase sequence cannot be completed. Table 5.9 CPU Clock When Operating Flash Memory (f(BCLK)) VCC1 = 1.8 to 5.5 V, Topr = -20 to 85°C/-40 to 85°C unless otherwise specified. Symbol Parameter Conditions Standard Unit Min. Typ. Max. - CPU rewrite mode 10 (1) MHz f(SLOW_R) Slow read mode 5MHz - Low current consumption read mode fC(32.768) 35 kHz - Data flash read 3.0 V < VCC1 ≤ 5.5 V 20 (2) MHz Table 5.10 Flash Memory (Program ROM 1, 2) Electrical Characteristics VCC1 = 2.7 to 5.5 V at Topr = 0 to 60°C (option: -40°C to 85°C), unless otherwise specified. Symbol Parameter Conditions Standard Unit Min. Typ. Max. - Program and erase cycles (1), (3), (4) VCC1 = 3.3 V, Topr = 25°C 1,000 (2) times - Two words program time VCC1 = 3.3 V, Topr = 25°C 150 4000 μs - Lock bit program time VCC1 = 3.3 V, Topr = 25°C 70 3000 μs - Block erase time VCC1 = 3.3 V, Topr = 25°C 0.2 3.0 s td(SR-SUS) Time delay from suspend request until suspend 5 + CPU clock × 3 cycles ms - Interval from erase start/restart until following suspend request 0 μs - Suspend interval necessary for auto-erasure to complete (7) 20 ms - Time from suspend until erase restart 30 + CPU clock × 1 cycle μs - Program, erase voltage 2.7 5.5 V - Read voltage 2.7 5.5 V - Program, erase temperature 0 60 °C tPS Flash Memory Circuit Stabilization Wait Time 50 μs - Data hold time (6) Ambient temperature = 55 °C 20 year |
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