поискавой системы для электроныых деталей
  Russian  ▼
ALLDATASHEETRU.COM

X  

ATmega162 датащи(PDF) 200 Page - ATMEL Corporation

номер детали ATmega162
подробное описание детали  8-bit Microcontroller with 16K Bytes In-System Programmable Flash
PDF  324 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
производитель  ATMEL [ATMEL Corporation]
домашняя страница  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

ATmega162 датащи(HTML) 200 Page - ATMEL Corporation

Back Button ATmega162 Datasheet HTML 196Page - ATMEL Corporation ATmega162 Datasheet HTML 197Page - ATMEL Corporation ATmega162 Datasheet HTML 198Page - ATMEL Corporation ATmega162 Datasheet HTML 199Page - ATMEL Corporation ATmega162 Datasheet HTML 200Page - ATMEL Corporation ATmega162 Datasheet HTML 201Page - ATMEL Corporation ATmega162 Datasheet HTML 202Page - ATMEL Corporation ATmega162 Datasheet HTML 203Page - ATMEL Corporation ATmega162 Datasheet HTML 204Page - ATMEL Corporation Next Button
Zoom Inzoom in Zoom Outzoom out
 200 / 324 page
background image
200
2513K–AVR–07/09
ATmega162/V
TAP Controller
The TAP controller is a 16-state finite state machine that controls the operation of the Boundary-
scan circuitry, JTAG programming circuitry, or On-chip Debug system. The state transitions
depicted in Figure 84 depend on the signal present on TMS (shown adjacent to each state tran-
sition) at the time of the rising edge at TCK. The initial state after a Power-on Reset is Test-
Logic-Reset.
As a definition in this document, the LSB is shifted in and out first for all Shift Registers.
Assuming Run-Test/Idle is the present state, a typical scenario for using the JTAG interface is:
At the TMS input, apply the sequence 1, 1, 0, 0 at the rising edges of TCK to enter the Shift
Instruction Register – Shift-IR state. While in this state, shift the four bits of the JTAG
instructions into the JTAG Instruction Register from the TDI input at the rising edge of TCK.
The TMS input must be held low during input of the 3 LSBs in order to remain in the Shift-IR
state. The MSB of the instruction is shifted in when this state is left by setting TMS high.
While the instruction is shifted in from the TDI pin, the captured IR-state 0x01 is shifted out
on the TDO pin. The JTAG Instruction selects a particular Data Register as path between
TDI and TDO and controls the circuitry surrounding the selected Data Register.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. The instruction is
latched onto the parallel output from the Shift Register path in the Update-IR state. The Exit-
IR, Pause-IR, and Exit2-IR states are only used for navigating the state machine.
At the TMS input, apply the sequence 1, 0, 0 at the rising edges of TCK to enter the Shift
Data Register – Shift-DR state. While in this state, upload the selected data register
(selected by the present JTAG instruction in the JTAG Instruction Register) from the TDI
input at the rising edge of TCK. In order to remain in the Shift-DR state, the TMS input must
be held low during input of all bits except the MSB. The MSB of the data is shifted in when
this state is left by setting TMS high. While the Data Register is shifted in from the TDI pin,
the parallel inputs to the Data Register captured in the Capture-DR state is shifted out on the
TDO pin.
Apply the TMS sequence 1, 1, 0 to re-enter the Run-Test/Idle state. If the selected data
register has a latched parallel-output, the latching takes place in the Update-DR state. The
Exit-DR, Pause-DR, and Exit2-DR states are only used for navigating the state machine.
As shown in the state diagram, the Run-Test/Idle state need not be entered between selecting
JTAG instruction and using Data Registers, and some JTAG instructions may select certain
functions to be performed in the Run-Test/Idle, making it unsuitable as an Idle state.
Note:
Independent of the initial state of the TAP Controller, the Test-Logic-Reset state can always be
entered by holding TMS high for five TCK clock periods.
For detailed information on the JTAG specification, refer to the literature listed in “Bibliography”
on page 203.
Using the
Boundary-scan
Chain
A complete description of the Boundary-scan capabilities are given in the section “IEEE 1149.1
(JTAG) Boundary-scan” on page 204.



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100  ...More


датащи скачать

Go To PDF Page


ссылки URL



Вашему бизинису помогли Аллдатащит?  [ DONATE ] 

Что такое Аллдатащит   |   реклама   |   контакт   |   Конфиденциальность   |   Ссылка на техническое описание    |   обмен ссыками   |   поиск по производителю
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com