MX879

2

06/08/06

Drawing No. 087909

www.claremicronix.com

MX879

IXYS

Parameter

Symbol

Min

Max

Unit

VPWR Supply Voltage

VPWR

62

V

Logic Supply Voltage

VCC

6

V

Input Pin Voltage

6

V

Continuous Output Current

150

mA

Storage Temperature

-55

150

C

o

Operating Ambient Temp

-40

85

C

o

Operating Junction Temp

150

C

o

Thermal Resistance

(Junction to Ambient)

110 Typical

C

ESD Warning

ESD (electrostatic discharge) sensitive device. Although the MX879 features proprietary ESD protection circuitry,

permanent damage may be sustained if subjected to high energy electrostatic discharges. Proper ESD precautions

are recommended to avoid performance degradation or loss of functionality.

DC Electrical Characteristics

Parameter

Condition

Min

Typ

Max

Unit

Logic Supply Voltage

2.7

5.5

V

Logic Supply Current

fSCK = 5 MHz

50

µA

Quiescent Logic Supply Current

fSCK = 0

1

µA

VPWR Voltage

6

60

V

VPWR Current

Total of all outputs

600

mA

Quiescent VPWR Current

VPWR = 42V, No load

0.75

mA

High Level Input Voltage

IN0-7, SCK, SDI, OE, CS

VCC-0.5

V

Low Level Input Voltage

0.5

V

Input Leakage Current

1

µA

SDO Tri-State Leakage Current

CS = Logic High

1

µA

Out0-7 Current

Any one output, source

120

mA

Out0-7 ON Resistance

VPWR = 42V

7

Ω

Out0-7 Tri-State Leakage Current

OE = Logic Low

1

µA

Notes: To avoid unwanted output during VPWR application and system initialization, keep OE at a logic

low until CS has completed one cycle.

Thermal Resistance is measured in still air with the device soldered to a 6 square inch board

without a ground plane. Applications may require derating of the specified maximum currents to

avoid exceeding the maximum operation junction temperature.

Absolute Maximum Ratings are

stress ratings. Stresses in excess of

these ratings can cause permanent

damage to the device. Functional

operation of the device at these or

any other conditions beyond those

indicated in the operational sections

of this data sheet is not implied.

Exposure of the device to the

absolute maximum ratings for an

extended period may degrade the

device and affect its reliability.