поискавой системы для электроныых деталей
  Russian  ▼
ALLDATASHEETRU.COM

X  

Preview PDF HTML

STM32F102C4 датащи(PDF) 60 Page - STMicroelectronics

номер детали STM32F102C4
подробное описание детали  Low-density USB access line, ARM-based 32-bit MCU with 16/32 KB Flash, USB FS interface, 5 timers, ADC & 5 communication interfaces
PDF  69 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
производитель  STMICROELECTRONICS [STMicroelectronics]
домашняя страница  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F102C4 датащи(HTML) 60 Page - STMicroelectronics

Back Button STM32F102C4 Datasheet HTML 56Page - STMicroelectronics STM32F102C4 Datasheet HTML 57Page - STMicroelectronics STM32F102C4 Datasheet HTML 58Page - STMicroelectronics STM32F102C4 Datasheet HTML 59Page - STMicroelectronics STM32F102C4 Datasheet HTML 60Page - STMicroelectronics STM32F102C4 Datasheet HTML 61Page - STMicroelectronics STM32F102C4 Datasheet HTML 62Page - STMicroelectronics STM32F102C4 Datasheet HTML 63Page - STMicroelectronics STM32F102C4 Datasheet HTML 64Page - STMicroelectronics Next Button
Zoom Inzoom in Zoom Outzoom out
 60 / 69 page
background image
Electrical characteristics
STM32F102x4, STM32F102x6
60/69
Doc ID 15057 Rev 3
Figure 27.
ADC accuracy characteristics
Figure 28.
Typical connection diagram using the ADC
1.
Refer to Table 44 for the values of RAIN, RADC and CADC.
2.
Cparasitic represents the capacitance of the PCB (dependent on soldering and PCB layout quality) plus the
pad capacitance (roughly 7 pF). A high Cparasitic value will downgrade conversion accuracy. To remedy
this, fADC should be reduced.
EO
EG
1LSBIDEAL
(1) Example of an actual transfer curve
(2) The ideal transfer curve
(3) End point correlation line
ET=Total u nadjusted er ror: maximum deviation
between the actual and the ideal transfer curves.
EO=Offset error: deviation between the first actual
transition and the first ideal one.
EG=Gain er ror: deviation between the last ideal
transition and the last actual one.
ED=Differential linearity error: maximum deviation
between actual steps and the ideal one.
EL=Integral linearity error:
maximum deviation
between any actual transition and the end point
correlation line.
4095
4094
4093
5
4
3
2
1
0
7
6
1
2
3
456
7
4093 4094 4095 4096
(1)
(2)
ET
ED
EL
(3)
VDDA
VSSA
ai15497
VDDA
4096
[1LSBIDEAL =
ai14974b
STM32F102
VDD
AINx
IL±1 µA
0.6 V
VT
RAIN(1)
Cparasitic
VAIN
0.6 V
VT
RADC(1)
12-bit
converter
CADC(1)
Sample and hold ADC
converter



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69


датащи скачать

Go To PDF Page


ссылки URL



Вашему бизинису помогли Аллдатащит?  [ DONATE ] 

Что такое Аллдатащит   |   реклама   |   контакт   |   Конфиденциальность   |   Ссылка на техническое описание    |   обмен ссыками   |   поиск по производителю
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com