TEST CIRCUIT

C1

100 pF

IN

1

3

6

2, 4, 5

OUT

GND

R1

560

Ω

L1

56 nH

L2

2.2 nH

Microstrip Line

(W = 1.05 mm, L = 2.5 mm)

Microstrip Line

(W = 0.2 mm, L = 2.9 mm)

C3

1 000 pF

C4

1 000 pF

C5

1 000 pF

C2

100 pF

The application circuits and their parameters are for reference only and are not intended for use in actual design-ins.

COMPONENTS OF TEST CIRCUIT FOR MEASURING

ELECTRICAL CHARACTERISTICS

Type

Value

R1

Chip Resistance

560

Ω

L1

Chip Inductor

56 nH

L2

Chip Inductor

2.2 nH

C1, C2

Chip Capacitor

100 pF

C3, C4

Chip Capacitor

1 000 pF

C5

Feed-through Capacitor

1 000 pF

INDUCTOR FOR THE OUTPUT PIN

The internal output transistor of this IC, to output medium power. To supply current for output transistor, connect

The inductor has both DC and AC effects. In terms of DC, the inductor biases the output transistor with minimum

voltage drop to output enable high level. In terms of AC, the inductor makes output-port impedance higher to get

enough gain. In this case, large inductance and Q is suitable (Refer to the following page).

the input and output pins.

The coupling capacitors, connected to the input and output pins, are used to cut the DC and minimize RF serial

impedance. Their capacitances are therefore selected as lower impedance against a 50

Ω load. The capacitors thus

perform as high pass filters, suppressing low frequencies to DC.

To obtain a flat gain from 100 MHz upwards, 1 000 pF capacitors are used in the test circuit. In the case of under

10 MHz operation, increase the value of coupling capacitor such as 10 000 pF. Because the coupling capacitors are

determined by equation, C = 1/(2

πRfc).

Data Sheet PU10734EJ01V0DS

5