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SN74ALS280DR датащи(PDF) 2 Page - Texas Instruments

номер детали SN74ALS280DR
подробное описание детали  9-BIT PARITY GENERATORS/CHECKERS
PDF  12 Pages
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производитель  TI [Texas Instruments]
домашняя страница  http://www.ti.com
Logo TI - Texas Instruments

SN74ALS280DR датащи(HTML) 2 Page - Texas Instruments

  SN74ALS280DR Datasheet HTML 1Page - Texas Instruments SN74ALS280DR Datasheet HTML 2Page - Texas Instruments SN74ALS280DR Datasheet HTML 3Page - Texas Instruments SN74ALS280DR Datasheet HTML 4Page - Texas Instruments SN74ALS280DR Datasheet HTML 5Page - Texas Instruments SN74ALS280DR Datasheet HTML 6Page - Texas Instruments SN74ALS280DR Datasheet HTML 7Page - Texas Instruments SN74ALS280DR Datasheet HTML 8Page - Texas Instruments SN74ALS280DR Datasheet HTML 9Page - Texas Instruments Next Button
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SN74ALS280, SN74AS280
9-BIT PARITY GENERATORS/CHECKERS
SDAS038C – DECEMBER 1982 – REVISED DECEMBER 1994
2
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
logic diagram (positive logic)
A
B
C
D
E
F
G
H
I
8
9
10
11
12
13
1
2
4
5
6
Σ EVEN
Σ ODD
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage, VCC
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage, VI
7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range, TA: SN74ALS280
0
°C to 70°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
– 65
°C to 150°C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.



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