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SSD40N03 датащи(PDF) 2 Page - SeCoS Halbleitertechnologie GmbH |
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SSD40N03 датащи(HTML) 2 Page - SeCoS Halbleitertechnologie GmbH |
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2 / 5 page ![]() Electrical Characteristics( Tj=25 C Unless otherwise specified) http://www.SeCoSGmbH.com/ Any changing of specification will not be informed individual o 01-Jun-2002 Rev. A Page 2 of 5 Notes: 2. Pulse width limited by safe operating area. Pulse width 300us, dutycycle 2%. ≦ ≦ 1. Total Gate Charge Crss Qg Qgs Qgd Td(ON) Td(Off) Tr Ciss Coss Tf 17 3 10 7.2 60 22.5 10 800 380 133 nC nS pF Gate-Source Charge Gate-Drain ("Miller") Charge Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance VGS=0V VDS=25V f=1.0MHz VDD=15V ID=18A VGS=10V RG=3.3 RD=0.83 Ω Ω ID=18A VDS=24V VGS= 5V _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ IDSS 25 250 21 30 uA uA m 26 Drain-Source Leakage Current (Tj=25 ) Static Drain-Source On-Resistance Drain-Source Leakage Current(Tj=150 ) Ω VGS=10V, ID=18A VGS=4.5V, ID=14A VDS=30V,VGS=0 VDS=24V,VGS=0 _ _ _ _ _ _ Forward Transconductance Gfs S VDS=10V, ID=18A _ _ oC oC 2 2 RDS(ON) 18 24 BVDSS BVDS/ Tj 30 0.037 1.0 3.0 100 ± V V/ Reference to 25C, ID=1mA o oC V nA Parameter Symbol Max. Typ. Test Condition Min. Unit Drain-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Gate Threshold Voltage Gate-Source Leakage Current VGS(th) IGSS VGS=0V, ID=250uA VGS= 20V ± VDS=VGS, ID=250uA _ _ _ _ _ _ _ Source-Drain Diode Parameter Symbol Max. Typ. Test Condition Min. Unit Forward On Voltage Continuous Source Current(Body Diode) IS _ Pulsed Source Current(Body Diode) _ ISM A A VD=VG=0V,VS=1.3 V 36 150 36 VSD _ _ IS= A, VGS=0V.Tj=25C V 1.3 o 2 1 _ _ Elektronische Bauelemente SSD40N03 36A, 30V,RDS(ON)21m N-Channel Enhancement Mode Power Mos.FET Ω |
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