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SWEPT WAVELENGTH SYSTEM (SWS-OMNI EXPANSION SERIES)

Swept Wavelength System

(SWS-OMNI Expansion Series)

Key Features

• Virtual Modulation Frequency Feature (VMFF) - flexible

post-processing

• Measures IL, PDL, GD, DGD with a single bench or rack

mountable receiver

• Distributed Architecture - Add additional measurement

stations at any time

• Wideband scanning 1520 to 1630 nm, in one sweep

• High speed; two-channel device characterization over

C-band or C+L-bands for simultaneous measurement

of all parameters

• Calibrated to NIST CD and Polarization Mode Dispersion

(PMD) standards

• Powerful engineering software package + DLL library -

custom software applications

With the simple addition of an RF modulator within the SOM and an OMNI

receiver, an existing Swept Wavelength System SWS2000 system can be used to

measure group delay (GD) and differential group delay (DGD). Existing test

stations can still be used.

SWS-OMNI adds to the SWS family of test systems and provides leading-edge

performance for fast all-parameter testing for efficient engineering, research and

development (R&D) and production testing operations. SWS-OMNI rapidly and

accurately measures insertion loss (IL), polarization dependent loss (PDL), GD

and DGD characteristics of a wide range of passive optical components and optical

fiber using a dual channel receiver for higher-throughput and lower-cost testing.

The modular architecture of the SWS-OMNI enables a user to add the SWS-

OMNI receiver to an existing SWS transmitter to provide a stand-alone all

parameter test station without the added expenditure of another tunable laser and

wavelength meter. These additional test stations are purchased at a relatively low

incremental cost providing best multi-station capital expenditure economics in

the industry.

From phase and IL measurements, SWS-OMNI software calculates CD, PDL, GD

and DGD as a function of wavelength or frequency. Displayed data may be further

analyzed on-screen using markers, or setup to automatically analyze the data in

the parameter ranges defined. This data can be exported for further analysis. The

software also has dynamic link libraries (DLLs) that can be used to easily develop

custom software in LabVIEW, Visual Basic or C+ a feature that is especially useful

in a production environment.

Applications

• Passive optical component and fiber

characterization in lab and

manufacturing environments.

Safety Information

• Complies to CE requirements plus

UL3101.1 and CAN/CSA-C22.2 No.

1010.1. The laser source in the

Source Optics Module is a class 1

laser. The Tunable Laser Source

(SWS-17101) is a class 3B laser. Both

are classified per IEC standard

60825-1 (2002) and comply with

FDA standard 21CFR 1040.10 except

deviations per Laser Notice No. 50,

July 2001.