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TC534CPL датащи(PDF) 12 Page - TelCom Semiconductor, Inc |
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TC534CPL датащи(HTML) 12 Page - TelCom Semiconductor, Inc |
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12 / 15 page ![]() 3-58 TELCOM SEMICONDUCTOR, INC. 5V PRECISION DATA ACQUISITION SUBSYSTEMS TC530 TC534 Figure 6. TC530/534 Typical Application A0 A1 RESET EOC VCCD VCCD VDD VDD D OUT D CLK X1: 2MHz R2 100k R1 100k 100 Ω 1 µF TC04 (1.25V VREF) (1.03V) D IN R/W ACOM OSC IN OSC OUT V SS DGND C AZ C AZ 0.22 µF C IN 0.33 µF R INT 100k TC534 C INT Analog Inputs Channel Control C1 .01 µF 10 µF MUX IN1 + IN1 – IN2 + IN2 – IN3 + IN3 – IN4 + IN4 – +5V +5V –5V (Optional) BUF V REF + V REF – + C REF C REF – C REF 0.22 µF + CAP CAP – 1 µF +5V INT PROCESSOR I/O I/O I/O I/O .01 µF .01 µF 1 µF 3. Calculate LOAD VALUE LOAD VALUE = 256 – (tINT)(FIN)/1024 = [128]10 [128]10 = 80 hex 4. Calculate RINT RINT (in MΩ) = VINMAX/20 = 2/20 = 100kΩ 5. Calculate CINT for maximum (4V) integrator out- put swing CINT (in µF) = (tINT)(20 x 10 –6)/ (VS – 0.9) = (.066)(20 x 10 –6)/(4.1) = .32 µF (use closest value: 0.33µF) NOTE: TelCom recommended capacitor: WIMA p/n: MK12 .33/63/10 6. Choose CREF and CAZ based on conversion rate Conversions/sec = 1/(tAZ + tINT + 2tINT + 2msec) = 1/(66msec + 66msec + 132msec + 2msec) = 3.7 conversions/sec from which CAZ = CREF = 0.22µF (see Table 1) NOTE: TelCom recommended capacitor: WIMA p/n: MK12 .22/63/10 7. Calculate VREF VREF (in Volts = (VS – 0.9)(CINT)(RINT) 2(tINT) = (4.1)(0.33x10 –6)(105)/2(.066) = 1.025V Power Supply Sequencing Improper sequencing of the power supply inputs (VDD vs. VCCD) can potentially cause an improper power-up sequence to occur. See Circuit Design/Layout Consider- ations below. Failing to insure a proper power-up sequence can cause spurious operation. Ciruit Design/Layout Considerations (1) Separate ground return paths should be used for the analog and digital circuitry. Use of ground planes and trace fill on analog circuit sections is highly recommended EXCEPT for in and around the integrator section and CREF, CAZ. (CINT, CREF, CAZ, RINT). Stray capacitance be- tween these nodes and ground appears in parallel with the components themselves and can affect measurement accu- racy. |
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