4-120

TELCOM SEMICONDUCTOR, INC.

Symbol

Parameter

Test Conditions

Min

Typ

Max

Unit

Reference Voltage

Output Voltage

5

5.1

5.3

V

Line Regulation

5

15

mV

Load Regulation

13

20

mV

Temperature Coefficient

Over Operating Temperature Range

0.4

0.5

mV/

°C

Oscillator

Oscillator Frequency

35

42

46

kHz

Voltage Stability

1.1

1.5

%/V

Temperature Stability

Over Operating Temperature Range

5

10

%

Error Amplifier

Input Offset Voltage

30

mV

Input Bias Current

1nA

Common-Mode Input Voltage

0

V

Open-Loop Voltage Gain

70

dB

BW

Unity Gain Bandwidth

1.2

MHz

CMRR

Common-Mode Rejection Ratio

60

dB

PSRR

Power Supply Rejection Ratio

60

dB

Current Sense Amplifier

Amplifier Gain

Pin 3 = 0V to 1.1V

3

3.15

3.3

V/V

Maximum Differential Input Signal

≤1.1

V

Common-Mode Input Voltage

0

V

Current Limit Adjust

Current Limit Offset Voltage

0.5

1

V

Input Bias Current

1nA

Shutdown Terminal

Threshold Voltage

0.3

0.35

0.4

V

Input Voltage Range

0

V

Minimum Latching Current at Pin 1

125

µA

Maximum Nonlatching Current at Pin 1

50

µA

Output Stage

Output Voltage

Pin 13

V

Output Low Level

0.4

V

Output Low Level

2

V

ABSOLUTE MAXIMUM RATINGS*

Supply Voltage ............................................................ 18V

Storage Temperature Range ................ – 65

°C to +150°C

Lead Temperature (Soldering, 10 sec) ................. +300

°C

Maximum Chip Temperature ................................... 150

°C

Plastic Package Thermal Resistance:

CMOS CURRENT MODE

PWM CONTROLLER

TC170

Operating Temperature Range

Commercial ........................................... 0

°C to +70°C

*Static-sensitive device. Unused devices must be stored in conductive

material. Protect devices from static discharge and static fields. Stresses

above those listed under Absolute Maximum Ratings may cause perma-

nent damage to the device. These are stress ratings only and functional

operation of the device at these or any other conditions above those

indicated in the operational sections of the specifications is not implied.

Exposure to Absolute Maximum Rating Conditions for extended periods

may affect device reliability.