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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LW520AS датащи(PDF) 18 Page - Seoul Semiconductor |
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LW520AS датащи(HTML) 18 Page - Seoul Semiconductor |
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18 / 18 page  Document No. : SSC-QP-7-07-24 (Rev.00) Rev. 03 Rev. 03 January 2009 January 2009 www.ZLED.com www.ZLED.com 12. Reliability Test Item and Condition 0/22 1 time 1kV, 1.5kΩ ; 100pF ESD (Human Body Model) 0/40 100 cycles T a = -40ºC (30min) ~ 100º (30min) (Transfer time : 10sec, 1Cycle = 1hr) Thermal Shock 0/22 100hrs T a = 85ºC, RH = 85%, I F = 8mA Temperature Humidity Operating 0/22 1000hrs T a = 85ºC, RH = 85% Temperature Humidity Storage 0/22 1000hrs T a = -40ºC Low Temperature Storage 0/22 1000hrs T a = 100ºC High Temperature Storage 0/22 0/22 0/22 0/22 Failures 1 time T s = 255 ± 5ºC, t = 10sec Resistance to soldering Heat 1000hrs T a = 85ºC, IF = 8mA High Temperature Operating 1000hrs T a = -30ºC, IF = 20mA Low Temperature Operating 1000hrs T a = RT, IF = 30mA Life Test Note Condition Item < Judging Criteria For Reliability Tests > LSL [2] X 0.7 Ф V USL X 2.0 I R USL[1] X 1.2 V F Notes : [1] USL : Upper Standard Level [2] LSL : Lower Standard Level. |
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