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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LR770D датащи(PDF) 5 Page - Seoul Semiconductor |
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LR770D датащи(HTML) 5 Page - Seoul Semiconductor |
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5 / 12 page  Rev. 00 Rev. 00 December 2007 December 2007 www.ZLED.com www.ZLED.com 서식번호 : SSC-QP-7-07-24 (Rev.00) <080226> Rev. 0.2 4. Reliability Tests Item Condition Note Failures Life Test T a = RT, IF = 30mA 1000hrs 0/22 0/22 0/22 Thermal Shock T a = -50ºC (30min) ~ 105º (30min) (Transfer time : 10sec, 1Cycle = 1hr) 100 cycles 0/40 ESD (Human Body Model) 1kV, 1.5kΩ ; 100pF 1 time 0/22 0/22 High Temperature Storage T a = 105ºC 1000hrs 0/22 Low Temperature Storage T a = -50ºC 1000hrs 0/22 Temperature Humidity Storage T a = 85ºC, RH = 85% 1000hrs 0/22 Temperature Humidity Operating T a = 85ºC, RH = 85%, I F = 15mA 100hrs 0/22 High Temperature Operating T a =100ºC, IF = 10mA 1000hrs Resistance to soldering Heat T s = 255 ± 5ºC, t = 10sec 1 time Low Temperature Operating T a = -40ºC, IF = 20mA 1000hrs < Judging Criteria For Reliability Tests > USL[1] X 1.2 V F USL X 2.0 I R Ф V LSL [2] X 0.7 Notes : [1] USL : Upper Standard Level [2] LSL : Lower Standard Level. |
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