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VN710SP

ISO T/R 7637/1

Test Pulse

TEST LEVELS

I

II

III

IV

Delays and Impedance

1

-25V

-50V

-75V

-100V

2ms, 10

Ω

2

+25V

+50V

+75V

+100V

0.2ms, 10

Ω

3a

-25V

-50V

-100V

-150V

0.1ms, 50

Ω

3b

+25V

+50V

+75V

+100V

0.1ms, 50

Ω

4

-4V

-5V

-6V

-7V

100ms, 0.01

Ω

5

+26.5V

+46.5V

+66.5V

+86.5V

400ms, 2

Ω

ISO T/R 7637/1

Test Pulse

TEST LEVELS RESULT

III

III

IV

1

C

C

C

C

2

CCCC

3a

CCCC

3b

CCCC

4

CCCC

5

C

EEE

CLASS

CONTENTS

C

All functions of the device are performed as designed after exposure to disturbance.

E

One or more functions of the device is not performed as designed after exposure and cannot be

returned to proper operation without replacing the device.

SUGGESTED SCHEME FOR ISO TEST PULSE

OUTPUT

GND

STATUS

INPUT

ENABLE

open

from test

generator

10K

Ω

10K

Ω

10K

Ω

negative transient.