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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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LPC2292 датащи(PDF) 37 Page - NXP Semiconductors |
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LPC2292 датащи(HTML) 37 Page - NXP Semiconductors |
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37 / 53 page  LPC2292_2294_7 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 7 — 4 December 2008 37 of 53 NXP Semiconductors LPC2292/LPC2294 16/32-bit ARM microcontrollers with external memory interface Test conditions: Power-down mode entered executing code from on-chip flash. Fig 12. Typical LPC2292/01 core power-down current IDD(pd) measured at different temperatures 0 40 80 120 160 200 1.65 V 1.8 V 1.95 V 002aad108 -40 -15 10 35 60 85 temperature ( °C) IDD(pd) ( µA) Test conditions: Active mode entered executing code from on-chip flash; PCLK = CCLK ⁄ 4; Tamb =25 °C; core voltage 1.8 V. Fig 13. Typical LPC2294/01 IDD(act) measured at different frequencies 002aad109 0.0 10.0 20.0 30.0 40.0 50.0 12 20 28 36 44 52 60 frequency (MHz) IDD(act) (mA) all peripherals enabled all peripherals disabled |
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