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M48T02 датащи(PDF) 15 Page - STMicroelectronics |
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M48T02 датащи(HTML) 15 Page - STMicroelectronics |
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15 / 24 page ![]() M48T02, M48T12 Clock operations 15/24 Figure 8. Crystal accuracy across temperature Figure 9. Clock calibration 3.5 VCC noise and negative going transients ICC transients, including those produced by output switching, can produce voltage fluctuations, resulting in spikes on the VCC bus. These transients can be reduced if capacitors are used to store energy which stabilizes the VCC bus. The energy stored in the bypass capacitors will be released as low going spikes are generated or energy will be absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1µF (as shown in Figure 10 on page 16) is recommended in order to provide the needed filtering. In addition to transients that are caused by normal SRAM operation, power cycling can generate negative voltage spikes on VCC that drive it to values below VSS by as much as one volt. These negative spikes can cause data corruption in the SRAM while in battery backup mode. To protect from these voltage spikes, it is recommended to connect a AI02124 -80 -60 -100 -40 -20 0 20 0 5 10 15 20 25 30 35 40 45 50 55 60 65 70 ΔF = -0.038 (T - T 0) 2 ± 10% F ppm C 2 T 0 = 25 °C ppm °C AI00594B NORMAL POSITIVE CALIBRATION NEGATIVE CALIBRATION |
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