KBMF

4/8

Please note that the KBMF01SC6 is not only acting for positive ESD surges but also for negative ones.

For these kind of disturbances it clamps close to ground voltage as shown in the Negative Surge figure.

3. LATCH-UP PHENOMENA

The early ageing and destruction of IC’s is often due to latch-up phenomena which is mainly induced by

dV/dt. Thanks to its structure, the KBMF01SC6 provides a high immunity to latch-up phenomena by

smoothing very fast edges.

Figure 5: Measurement conditions

TEST BOARD

ESD

SURGE

16kV

Air

Discharge

Vin

Vout

Positive surge

Negative surge