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4

3

1

2

DE

D

RE

R

6

7

A

B

LOGIC DIAGRAM (POSITIVE LOGIC)

5

4

2

3

DE

D

RE

R

12

11

A

B

10

9

Y

Z

SN65MLVD202A, SN65MLVD205A

SN65MLVD200A, SN65MLVD204A

PACKAGE DISSIPATION RATINGS

ABSOLUTE MAXIMUM RATINGS

SN65MLVD200A, SN65MLVD202A

SN65MLVD204A, SN65MLVD205A

SLLS573 – DECEMBER 2003

These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ORDERING INFORMATION

FOOTPRINT

RECEIVER TYPE

PACKAGE MARKING

SN65MLVD200AD

SN75176

Type 1

MF200A

SM65MLVD202AD

SN75ALS180

Type 1

MLVD202A

SN65MLVD204AD

SN75176

Type 2

MF204A

SM65MLVD205AD

SN75ALS180

Type 2

MLVD205A

(1)

Available tape and reeled. To order a tape and reeled part, add the suffix R to the part number (e.g., SN65MLVD200ADR).

DERATING FACTOR

PACKAGE

POWER RATING

POWER RATING

D(8)

532 mW

4.6 mW/

°C

254 mW

D(14)

940 mW

8.2 mW/

°C

450 mw

SN65MLVD200A,

202A, 204A, and 205A

–0.5 V to 4 V

D, DE, RE

–0.5 V to 4 V

Input voltage range

A, B (200A, 204A)

–1.8 V to 4 V

A, B (202A, 205A)

–4 V to 6 V

R

–0.3 V to 4 V

Output voltage range

Y, Z, A, or B

–1.8 V to 4 V

A, B, Y, and Z

±8 kV

Electrostatic discharge

All pins

±4 kV

All pins

±1500 V

Continuous power dissipation

See Dissipation Rating Table

Storage temperature range

–65

°C to 150°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.

(3)

Tested in accordance with JEDEC Standard 22, Test Method A114-A.

(4)

Tested in accordance with JEDEC Standard 22, Test Method C101.

2

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