74LVC1G53

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© NXP Semiconductors N.V. 2016. All rights reserved.

Product data sheet

Rev. 10 — 7 December 2016

7 of 27

NXP Semiconductors

74LVC1G53

2-channel analog multiplexer/demultiplexer

10.1 Test circuits

10.2 ON resistance

VI =VCC or GND; VO = GND or VCC.

Fig 7.

Test circuit for measuring OFF-state leakage current

VI =VCC or GND and VO = open circuit.

Fig 8.

Test circuit for measuring ON-state leakage current

Table 8.

ON resistance

At recommended operating conditions; voltages are referenced to GND (ground 0 V); for graphs see Figure 10 to Figure 15.

Symbol

Parameter

Conditions

40 C to +85 C

40 C to +125 C Unit

Min

Typ[1]

Max

Min

Max

RON(peak) ON resistance (peak) VI =GND to VCC; see Figure 9

ISW =4mA;

VCC = 1.65 V to 1.95 V

-

34.0

130

-

195



ISW =8mA; VCC = 2.3 V to 2.7 V

-

12.0

30

-

45



ISW =12mA; VCC = 2.7 V

-

10.4

25

-

38



ISW =24mA; VCC =3Vto3.6 V

-

7.8

20

-

30



ISW =32mA; VCC = 4.5 V to 5.5 V

-

6.2

15

-

23

