74HC_HCT2G86

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© NXP Semiconductors N.V. 2014. All rights reserved.

Product data sheet

Rev. 4 — 14 March 2014

8 of 15

NXP Semiconductors

74HC2G86; 74HCT2G86

Dual 2-input EXCLUSIVE-OR gate

Test data is given in Table 10.

Definitions for test circuit:

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

CL = Load capacitance including jig and probe capacitance.

RL = Load resistance.

S1 = Test selection switch.

Fig 7.

Test circuit for measuring switching times

VM

VM

tW

tW

10 %

90 %

0 V

VI

VI

negative

pulse

positive

pulse

0 V

VM

VM

90 %

10 %

tf

tr

tr

tf

001aad983

DUT

VCC

VCC

VI

VO

RT

RL

S1

CL

open

G

Table 10.

Test data

Type

Input

Load

S1 position

VI

tr, tf

CL

RL

tPHL, tPLH

74HC2G86

GND to VCC

 6 ns

50 pF

1 k



open

74HCT2G86

GND to 3 V

 6 ns

50 pF

1 k



open