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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M58LW032A датащи(PDF) 29 Page - STMicroelectronics |
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M58LW032A датащи(HTML) 29 Page - STMicroelectronics |
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29 / 61 page  29/61 M58LW032A MAXIMUM RATING Stressing the device above the ratings listed in Ta- ble 11, Absolute Maximum Ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicat- ed in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rat- ing conditions for extended periods may affect de- vice reliability. Refer also to the STMicroelectronics SURE Program and other rel- evant quality documents. Table 11. Absolute Maximum Ratings Symbol Parameter Value Unit Min Max TBIAS Temperature Under Bias –40 125 °C TSTG Storage Temperature –55 150 °C VIO Input or Output Voltage –0.6 VDDQ +0.6 V VDD, VDDQ Supply Voltage –0.6 5.0 V |
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