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поискавой системы для электроныых деталей |
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поискавой системы для электроныых деталей |
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M58BW016BB датащи(PDF) 30 Page - STMicroelectronics |
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M58BW016BB датащи(HTML) 30 Page - STMicroelectronics |
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30 / 63 page  M58BW016BT, M58BW016BB, M58BW016DT, M58BW016DB 30/63 MAXIMUM RATING Stressing the device above the ratings listed in Ta- ble 12, Absolute Maximum Ratings, may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicat- ed in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rat- ing conditions for extended periods may affect de- vice reliability. Refer also to the STMicroelectronics SURE Program and other rel- evant quality documents. Table 12. Absolute Maximum Ratings Note: Cumulative time at a high voltage level of 13.5V should not exceed 80 hours on VPP pin. Symbol Parameter Value Unit Min Max TBIAS Temperature Under Bias –40 125 °C TSTG Storage Temperature –55 155 °C VIO Input or Output Voltage –0.6 VDDQ +0.6 VDDQIN +0.6 V VDD, VDDQ, VDDQIN Supply Voltage –0.6 4.2 V VPP Program Voltage –0.6 13.5 (1) V |
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